The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Aug. 28, 2023
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
Garth Jason Simpson, West Lafayette, IN (US);
Andreas C. Geiger, Columbia City, IN (US);
Assignee:
PURDUE RESEARCH FOUNDATION, West Lafayette, IN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6408 (2013.01); G01N 21/6402 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 21/365 (2013.01); G01N 2201/06113 (2013.01);
Abstract
Methods for measuring diffusion in a medium. One method includes dissolving a fluorescent sample in a medium, imaging the fluorescent sample with a patterned illumination Fluorescence Recovery After Photobleaching (FRAP) technique, and analyzing a set of microscope images of the photobleached dissolved fluorescent sample with the patterned illumination using a Fourier Transform (FT) FRAP technique.