logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12055480 B1

PDFFull Text
Date of Patent:
Aug. 06, 2024

Filed:

Oct. 05, 2020

Method for predicting a property value of interest of a material

Applicant:

Evonik Operations Gmbh, Essen, DE;

Inventors:

Ingolf Reimann, Reinheim, DE;

Joachim Reising, Kleinostheim, DE;

Assignee:

Evonik Operations GmbH, Essen, DE;

Attorney:

Oblon, McClelland, Maier & Neustadt, L.L.P.

Primary Examiner:

Blake C Riddick

Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01J 3/28 (2006.01); G01N 21/359 (2014.01); G06F 17/16 (2006.01); G06F 18/214 (2023.01); G16C 20/20 (2019.01); G16C 20/30 (2019.01); G16C 60/00 (2019.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/359 (2013.01); G06F 17/16 (2013.01); G06F 18/214 (2023.01); G16C 20/20 (2019.02); G16C 20/30 (2019.02); G16C 60/00 (2019.02); G01J 2003/2866 (2013.01); G01N 2201/129 (2013.01);
Abstract

The present invention relates to a computer-implemented method for predicting a property value of interest in a sample investigated by infrared spectroscopy. The method aims at generating a calibration function. To this end, a set of calibration samples is selected, whereby outliers are identified and removed from the set of calibration samples. Outliers are determined using principal component analysis and singular value decomposition. The threshold value separating outliers from the remaining samples is calculated on the basis of a predetermined formulae. The threshold value may also be increased stepwise in order to dynamically set the threshold value, which is preferable for spectroscopic devices not operated under laboratory conditions.

Find Patent Forward Citations

Quick Actions:

Reimann, Ingolf. (2024). Method for predicting a property value of interest of a material (U.S. Patent No. 12055480). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12055480

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…