The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Aug. 26, 2021
Applicant:

Mireya C. Aronowitz, Delray Beach, FL (US);

Inventor:

Jack L. Aronowitz, Delray Beach, FL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01N 21/27 (2006.01); G01N 21/47 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); G01N 21/274 (2013.01); G01N 21/4738 (2013.01); G01N 21/8483 (2013.01);
Abstract

A reflectometer and method of use for measuring an amount of analyte in a sample are provided. The reflectometer can include a plurality of reading heads for obtaining reflectance information from discrete regions on a lateral flow test strip. The reflectance information is processed to obtain a digital value for the reflectance. The discrete regions can include a test zone and at least two control zones that each has a differing amount of detection moiety binding substance. The digital values for each control zone can be employed to establish a high end standard and a low end standard. The digital value for the test zone interpolated to the standards to obtain an accurate quantitative value for the analyte in the sample.


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