The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Sep. 06, 2022
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;

Inventors:

Jun Mitani, Yokohama Kanagawa, JP;

Takero Mukai, Yokohama Kanagawa, JP;

Takanobu Kojima, Yokohama Kanagawa, JP;

Masahiko Nakazono, Kawasaki Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 23/08 (2006.01); G01L 1/02 (2006.01); G01L 1/10 (2006.01); G01L 1/16 (2006.01); G01L 1/25 (2006.01);
U.S. Cl.
CPC ...
G01L 23/08 (2013.01); G01L 1/02 (2013.01); G01L 1/103 (2013.01); G01L 1/106 (2013.01); G01L 1/162 (2013.01); G01L 1/165 (2013.01); G01L 1/167 (2013.01); G01L 1/255 (2013.01);
Abstract

A stress estimation method for a machine structure according to an embodiment is provided with a calculation step of calculating a relationship between the stress generated at the evaluation target position and a physical quantity including a sound pressure or vibration generated at a detection position different from the evaluation target position during vibration of the machine structure. The stress estimation method for a machine structure is provided with a detection step of detecting the physical quantity generated at the detection position during operation of the machine structure. The stress estimation method for a machine structure is provided with an estimation step of estimating the stress generated at the evaluation target position during operation of the machine structure on the basis of the relationship calculated in the calculation step and the physical quantity detected in the detection step.


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