The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Sep. 25, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Saurabh Godha, Santa Clara, CA (US);

Hyojoon Bae, San Jose, CA (US);

Isaac T. Miller, Half Moon Bay, CA (US);

Robert W. Mayor, Half Moon Bay, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/36 (2006.01); G01C 21/18 (2006.01); G06T 7/73 (2017.01); H04W 4/02 (2018.01); H04W 4/38 (2018.01);
U.S. Cl.
CPC ...
G01C 21/3602 (2013.01); G01C 21/18 (2013.01); G06T 7/73 (2017.01); H04W 4/026 (2013.01); H04W 4/027 (2013.01); H04W 4/38 (2018.02);
Abstract

A device implementing a system for estimating device orientation includes at least one processor configured to obtain a first estimate for a heading of a device, the first estimate being based on output from a magnetometer of the device. The at least one processor is further configured to capture image data using an image sensor of the device, and determine at least one second estimate of the heading based on correlating the image data with mapping data. The at least one processor is further configured to determine a bias associated with output of the magnetometer based on the first estimate and the at least one second estimate, and adjusting output of the magnetometer based on the determined bias.


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