The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jun. 20, 2020
Applicant:

Sikora Ag, Bremen, DE;

Inventors:

Armin Holle, Achim, DE;

Christian Frank, Bremen, DE;

Assignee:

Sikora AG, Bremen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01); G01B 15/02 (2006.01); G01B 15/04 (2006.01);
U.S. Cl.
CPC ...
G01B 15/02 (2013.01); G01B 15/04 (2013.01); G01N 21/3581 (2013.01);
Abstract

A device for measuring a strand that is tubular includes a first radiation source to emit terahertz radiation in a first measurement region from an inside onto an inner surface of the strand. A first radiation receiver receives terahertz radiation reflected by the strand in a second measurement region. A first evaluation apparatus determines at least one geometric parameter of the strand in the first measurement region. A second radiation source emits terahertz radiation in the second measurement region from an outside onto an outer surface of the strand. A second radiation receiver receives terahertz radiation reflected by the strand in the second measurement region. A second evaluation apparatus determines at least one geometric parameter of the strand in the second measurement region. A third evaluation apparatus determines a change in the at least one geometric parameter of the strand between the first and second measurement regions.


Find Patent Forward Citations

Loading…