The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Oct. 20, 2020
Applicants:

Murata Manufacturing Co., Ltd., Nagaokakyo, JP;

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Frédéric Voiron, Barraux, FR;

Julien El Sabahy, Grenoble, FR;

Maxime Lemenager, Caen, FR;

Guy Parat, Claix, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 11/02 (2006.01); C25D 11/04 (2006.01); C25D 11/06 (2006.01); C25D 11/08 (2006.01); C25D 11/18 (2006.01); C25D 11/24 (2006.01); C25D 11/26 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01); H01L 49/02 (2006.01);
U.S. Cl.
CPC ...
C25D 11/022 (2013.01); C25D 11/045 (2013.01); C25D 11/06 (2013.01); C25D 11/18 (2013.01); H01L 23/5223 (2013.01); H01L 23/53223 (2013.01); H01L 28/75 (2013.01);
Abstract

A semiconductor device that includes a porous anodic region for embedding a structure. The porous anodic region is defined by a ductile hard mask. The ductility of the hard mask reduces the potential for the hard mask to crack during the formation by anodization of the porous anodic region. The ductile hard mask may be a metal. The metal may be selected to form a stable oxide when exposed to the anodization electrolyte thereby enabling the hard mask to self-repair if a crack occurs during the anodization process.


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