The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Apr. 26, 2022
Applicant:
New Day Diagnostics, Llc, Knoxville, TN (US);
Inventors:
Denise Kottwitz, Berlin, DE;
Jorn Lewin, Berlin, DE;
Anne Schlegel, Berlin, DE;
Reimo Tetzner, Berlin, DE;
Assignee:
New Day Diagnostics, LLC, Knoxville, TN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6886 (2018.01); C12Q 1/6848 (2018.01); C12Q 1/6858 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6886 (2013.01); C12Q 1/6848 (2013.01); C12Q 1/6858 (2013.01); C12Q 2600/154 (2013.01); C12Q 2600/156 (2013.01); C12Q 2600/158 (2013.01);
Abstract
The present invention relates to the field of pharmacogenomics and in particular to detecting the presence or absence of hypermethylated DNA. The detection of CpG methylation in marker DNA is useful for the diagnosis of cancers and the invention provides improved methods for this purpose. These improved methods allow in particular for a more sensitive detection of methylated marker DNA with high backgrounds of unmethylated marker DNA.