The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

May. 19, 2020
Applicant:

Westlake Compounds Holding, Reims, FR;

Inventors:

Nicolas Amouroux, Reims, FR;

Mustapha El Fouzari, Reims, FR;

Hossam Elaarag, Reims, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B41J 3/407 (2006.01); B05D 3/00 (2006.01); B05D 3/06 (2006.01); B29C 64/386 (2017.01); B29C 71/00 (2006.01); B29C 71/04 (2006.01); B41J 2/01 (2006.01); B41J 11/00 (2006.01); B41M 5/00 (2006.01); B41M 5/24 (2006.01); B41M 5/26 (2006.01);
U.S. Cl.
CPC ...
B41M 5/26 (2013.01); B05D 3/007 (2013.01); B05D 3/065 (2013.01); B29C 71/0009 (2013.01); B29C 71/04 (2013.01); B41J 2/01 (2013.01); B41J 3/4073 (2013.01); B41J 11/008 (2013.01); B41M 5/0088 (2013.01); B41M 5/24 (2013.01);
Abstract

Process for selectively and locally treating the surface of a part, wherein—a part having a surface to be treated is provided, said surface being defined by a direction P and a direction Q; —three-dimensional profilometric data are acquired from the surface to be treated, in order to obtain a set Fof three-dimensional data on the surface to be treated, said set Fassociating a height with each point in the plane PQ; —this set Fof digital data is processed digitally with a view to subtracting said curves, to obtain a set Fof reprocessed three-dimensional data; —this set Fof data is processed digitally, to obtain a set Fof binary data on the surface to be treated, said digital processing attributing, to each point on the surface, a first binary value or a second binary value, depending on at least one criterion related to the height of the point on the surface; —the surface is selectively and locally treated using said set Fof binary data, said surface treatment being performed only at points on the surface the binary datum of which has said first or said second binary value.


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