The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Sep. 22, 2023
Applicant:

CD Processing Ltd., London, GB;

Inventors:

Daniel Shaw, Haverford, PA (US);

James Saville, Easton, MD (US);

Assignee:

CD Processing, Ltd., London, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/344 (2006.01); B07C 5/36 (2006.01); G01N 24/08 (2006.01);
U.S. Cl.
CPC ...
B07C 5/344 (2013.01); B07C 5/361 (2013.01); G01N 24/081 (2013.01); B07C 2501/0018 (2013.01); B07C 2501/0036 (2013.01);
Abstract

Disclosed is a system and method for sorting copper-bearing ore to select portions having a target copper content. The system includes an analysis and selection station including first magnetic resonance analyzer measuring the copper content of input ore and a controlled diverter to divert portions of the input ore to a collection path when the copper content meets or exceeds a predetermined cut-off value. The predetermined cut-off is adjusted by a controller in response to the first magnetic resonance analyzer. A second magnetic resonance analyzer measures the copper content of the ore in a product path. That measurement is fed back to the controller to fine tune the adjusted cut-off value above, up or down, to optimize the yield of ore having the targeted copper content. The system may include a station for sizing the input ore, a station for sizing the output ore, and a station for sizing waste produced by the system.


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