The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jul. 14, 2020
Applicant:

Daegu Gyeongbuk Institute of Science and Technology, Daegu, KR;

Inventors:

Sungwon Lee, Dangjin-si, KR;

Nora Asyikin Binti Zulkifli, Daegu, KR;

Wooseong Jeong, Daegu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/22 (2006.01); G01L 1/12 (2006.01);
U.S. Cl.
CPC ...
A61B 5/225 (2013.01); G01L 1/12 (2013.01); A61B 2562/0223 (2013.01); A61B 2562/164 (2013.01);
Abstract

The present invention relates to a device for measuring grip strength including a basis; a cover coupled to the basis to form an enclosed pressure space separated from the outside; a cap disposed between the basis and the cover and configured to form a sensing space separated from the pressure space; magnets mounted on the cap or the basis to form a magnetic field; and a magnetic sensor for detecting change in the magnetic field. With this configuration, when measuring the grip strength of the user's hand, accuracy or sensitivity may be increased.


Find Patent Forward Citations

Lee, Sungwon. (2024). Grip strength measurement apparatus (U.S. Patent No. 12053286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12053286

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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