The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Jul. 07, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Yuchi Che, Santa Clara, CA (US);

Abbas Jamshidi Roudbari, Saratoga, CA (US);

Jean-Pierre S. Guillou, San Diego, CA (US);

Majid Esfandyarpour, Redwood City, CA (US);

Sebastian Knitter, San Francisco, CA (US);

Warren S. Rieutort-Louis, Cupertino, CA (US);

Tsung-Ting Tsai, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H10K 59/121 (2023.01); G09G 3/3266 (2016.01); H10K 59/35 (2023.01); H10K 59/90 (2023.01);
U.S. Cl.
CPC ...
H10K 59/1213 (2023.02); G09G 3/3266 (2013.01); H10K 59/353 (2023.02); H10K 59/90 (2023.02);
Abstract

An electronic device may include a display and an optical sensor formed underneath the display. The electronic device may include a plurality of transparent windows that overlap the optical sensor. The resolution of the display panel may be reduced in some areas due to the presence of the transparent windows. To mitigate diffraction artifacts, a first sensor (-) may sense light through a first pixel removal region having transparent windows arranged according to a first pattern. A second sensor (-) may sense light through a second pixel removal region having transparent windows arranged according to a second pattern that is different than the first pattern. The first and second patterns of the transparent windows may result in the first and second sensors having different diffraction artifacts. Therefore, an image from the first sensor may be corrected for diffraction artifacts based on an image from the second sensor.


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