The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Jul. 13, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Roohollah Amiri, San Diego, CA (US);

Srinivas Yerramalli, Hyderabad, IN;

Rajat Prakash, San Diego, CA (US);

Taesang Yoo, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); G01S 5/02 (2010.01); G01S 5/10 (2006.01); H04W 4/02 (2018.01);
U.S. Cl.
CPC ...
H04W 4/023 (2013.01); G01S 5/0218 (2020.05); G01S 5/0269 (2020.05); G01S 5/0284 (2013.01); G01S 5/10 (2013.01); H04W 4/025 (2013.01); H04W 24/10 (2013.01);
Abstract

Disclosed are techniques for wireless positioning. In an aspect, a user equipment (UE) determines a positioning measurement of a first multipath component of a radio frequency (RF) signal transmitted by a transmission-reception point (TRP), determines a first additional positioning measurement of a second multipath component of the RF signal, determines a second additional positioning measurement of a third multipath component of the RF signal, and transmits a measurement report to a location server, the measurement report including at least the positioning measurement, the first additional positioning measurement, the second additional positioning measurement, and one or more parameters associated with the first additional positioning measurement and the second additional positioning measurement.


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