The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Feb. 11, 2022
Quality Vision International Inc., Rochester, NY (US);
Stephanie M. Bloch, Penfield, NY (US);
Timothy Gerard Moriarty, Cleveland, GA (US);
Daniel C. Abbas, Webster, NY (US);
Quality Vision International Inc., Rochester, NY (US);
Abstract
An optical imaging system for a dimensional measuring machine including a digital sensor having an array of addressable pixels, a lens system that provides for forming an image of a test object on the digital sensor, and a variable size aperture of the lens that changes an f-number of the lens system for imaging points of the test object on the digital sensor at different spot sizes. An aperture controller varies the aperture size. An image controller groups contiguous clusters of one or more of the pixels having a common output such that the number of pixels within each of the clusters having a common output can be varied. A magnification controller that works in conjunction with the aperture controller and the image controller provides for (a) increasing the number of pixels within each of the clusters having a common output in accordance with an increase in the spot sizes at which points of the test object are imaged and (b) decreasing the number of pixels within each of the clusters having a common output in accordance with a decrease in the spot sizes at which points of the test object are imaged.