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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12051235 B1

PDFFull Text
Date of Patent:
Jul. 30, 2024

Filed:

Oct. 13, 2020

Machine learning a feature detector using synthetic training data

Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Brad Keserich, Eindhoven, NL;

Stephen O'Hara, Eindhoven, NL;

Nicholas Dronen, Eindhoven, NL;

Assignee:

Here Global B.V., Eindhoven, NL;

Attorney:

Alston & Bird LLP

Primary Examiner:

Randolph I Chu

Int. Cl.
CPC ...
G06K 9/62 (2022.01); G01C 21/00 (2006.01); G01C 21/36 (2006.01); G06F 18/214 (2023.01); G06K 9/66 (2006.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01); G06T 17/05 (2011.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06V 20/56 (2022.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G01C 21/3602 (2013.01); G01C 21/3841 (2020.08); G01C 21/3881 (2020.08); G06F 18/214 (2023.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 17/05 (2013.01); G06V 10/774 (2022.01); G06V 20/56 (2022.01); G06T 17/20 (2013.01);
Abstract

Synthetic training information/data of a second probe style is generated based on first probe information/data of a first probe style using a style transfer model. First probe information/data is defined. An instance of first probe information/data comprises labels and first probe style sensor information/data. A style transfer model generates training information/data based on at least a portion of the first probe information/data. An instance of training information/data corresponds to an instance of first probe information/data and comprises second probe style sensor information/data. The first and second probe styles are different. A second probe style model is trained using machine learning and the training information/data. The second probe style model is used to analyze second probe style second probe information/data to extract map information/data from the second probe information/data. Each instance of second probe data is captured by one or more second probe sensors of a second probe apparatus.

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