The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Nov. 25, 2020
Korea Electronics Technology Institute, Seongnam-si, KR;
Kyoung Won Min, Seongnam-si, KR;
Ganzorig Gankhuyag, Seoul, KR;
Haeng Seon Son, Seongnam-si, KR;
Seon Young Lee, Seoul, KR;
Young Bo Shim, Seongnam-si, KR;
Korea Electronics Technology Institute, Seongnam-si, KR;
Abstract
Provided is a deep learning-based panoptic segmentation accelerated processing technique using a complexity-based RPN skip method. An image segmentation system includes: a first processing unit configured to extract dynamic objects in an instance segmentation method by using an extracted feature; a calculation unit configured to control to skip some areas of the feature extracted at the network by the first processing unit, on the basis of complexity of the input image; a second processing unit configured to extract static objects in a semantic segmentation method by using the feature extracted at the network; and a fusion unit configured to fuse a result of extracting by the first processing unit and a result of extracting by the second processing unit. Accordingly, the panoptic segmentation method can be easily performed even in an embedded environment by reducing complexity for panoptic segmentation processing by reducing a calculation burden.