The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Jan. 13, 2022
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Prakhar Pradhan, Bangalore, IN;

Hrishikesh Sharma, Bangalore, IN;

Balamuralidhar Purushothaman, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/28 (2022.01); G06F 18/2413 (2023.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06V 10/26 (2022.01); G06V 10/44 (2022.01); G06V 10/77 (2022.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/26 (2022.01); G06V 10/28 (2022.01); G06V 10/44 (2022.01); G06V 10/7715 (2022.01); G06V 10/806 (2022.01); G06V 10/82 (2022.01);
Abstract

This disclosure relates to a system and method for attention-based surface crack segmentation. Existing methods do not efficiently handle the sub-problem of data imbalance and inaccurate predicted pixels are ignored. The present disclosure obtains a binary edge map by passing a m-channel image through an edge detection algorithm and concatenate the obtained binary edge map with a channel dimension to obtain a (m+1)-channel image. Feature maps are extracted from an encoder and a decoder by feeding the obtained (m+1)-channel image into a network, wherein the feature maps are convolved with an attention mask and merged in a fused network. The merged feature maps are up sampled and concatenated to obtain a final fused feature map. The final fused feature map is passed through a sigmoid activation function to obtain a probability map which is iteratively thresholded to obtain a binary predicted image. The binary image is indicative of crack pixels.


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