The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Aug. 31, 2021
Applicant:

Ford Global Technologies, Llc, Dearborn, MI (US);

Inventors:

Michael Herbert Oelscher, Bergheim, DE;

Moritz Martinius, Cologne, DE;

David Mark Newton, Cologne, DE;

Uemit Yigit, Cologne, DE;

Assignee:

Ford Global Technologies, LLC, Dearborn, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B23K 26/03 (2006.01); B23K 31/12 (2006.01); G01N 21/88 (2006.01); G06F 18/241 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B23K 26/032 (2013.01); B23K 31/125 (2013.01); G01N 21/8851 (2013.01); G06F 18/241 (2023.01); G06N 3/08 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30152 (2013.01);
Abstract

A method for determining defects that occur while carrying out a surface modification method of a surface region of a component includes providing an image sequence of a surface region to be assessed. Each image of the image sequence shows an image detail of the surface region and the image details of the individual images overlapping at least partially. The method further includes assigning the individual images to at least two image classes, where at least one image class among the at least two image classes is indicative of a defective image class. The method further includes checking whether a set of individual images of a predeterminable number of directly consecutive individual images in the image sequence have been assigned to the defective image class, and outputting a defect signal.


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