The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Nov. 05, 2021
Raytheon Company, Tewksbury, MA (US);
Philip A. Sallee, South Riding, VA (US);
Stephen J. Raif, Sachse, TX (US);
Nicole A. Haffke, La Vista, NE (US);
Raytheon Company, Tewksbury, MA (US);
Abstract
Systems and methods for VIIRS image processing. The method can include receiving image data of immediately adjacent VIIRS image scans including a first image scan and a second image scan. The first image scan and the second image scan provide a partially overlapping view of a geographic area. The method can further involve resampling columns of pixels of the first image scan and the second image scan. The resampling can include selecting, in the first image scan and the second image scan, a subset of pixel values in each column that correspond to a specified geographic distance. The method can further involve upsampling the selected pixels to an equal number of pixels in each column resulting in upsampled pixel values and interpolating the upsampled pixel values to produce modified first and second image scans.