The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Aug. 25, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Ushanandini Raghavan, Lexington, MA (US);
Daniel Robert Elgort, New York, NY (US);
KONINKLIIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A risk-adjusted assessment of a target facility's quality measures (e.g. mortality rate, length of stay, readmission rate, complications rate, etc.) is determined with respect to the quality measures of a broader population base. Patient cohorts are identified corresponding to particular ailments or treatments, and the target facility's risk-adjusted quality measures are determined for each cohort. When a particular quality measure for a target cohort indicates poor performance, factors that are determined to be relevant to the patients' outcomes are identified and used to create a control group of patients in the broader population who exhibit similar factors but had better outcomes than the patients of the target cohort. The care process (treatments, medications, interventions, etc.) that each of the target patients received is compared to the care process that each of the control patients received, to identify potential root-causes of the poorer performance.