The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Jul. 06, 2020
Oracle International Corporation, Redwood Shores, CA (US);
Amit Vaid, Bengaluru, IN;
Vijayalakshmi Krishnamurthy, Sunnyvale, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for generating a composite score for data quality are disclosed. Univariate analysis is performed on a plurality of data points corresponding to each of a first feature, a second feature, and a third feature of a data set. The univariate analysis includes at least a first type of analysis generating a first score having a first range of possible values, and a second type of analysis generating a second score having a second range of possible values. A first quality score is computed for the data values for the first, second, and third features based on a normalized first score and a normalized second score. Machine learning is performed on the data points corresponding to one or both of the first feature and the second feature having a first quality score above a threshold value to model the third feature.