The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Jul. 26, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Neeraj Ramkrishna Singh, Bangalore, IN;

James Albert O'Neill, Jr., Austin, TX (US);

Soma Shekar Naganna, Bangalore, IN;

Geetha Sravanthi Pulipaty, Bangalore, IN;

Abhishek Seth, Deoband, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2228 (2019.01);
Abstract

A method, a structure, and a computer system for mapping data fields. The exemplary embodiments may include, based on determining that a first data set and a second data set contain homogenous data, mapping at least one column of the first data set to at least one column of the second data set based on comparing at least one of relative column position and unique value sets. Based on determining that the first data set and the second data set contain heterogeneous data, the exemplary embodiments may include mapping the at least one column of the first data set to the at least one column of the second data set based on a difference between distribution signatures of unique value sets within each of the first data set and the second data set being less than a threshold.


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