The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Feb. 27, 2023
Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Prashant Nirantar, Monroe Township, NJ (US);

Stephen C Bossong, West Grove, PA (US);

Parul Singh, Hyderabad, IN;

Aditya Toleti, Hyderabad, IN;

Vikram Mirmira, Hyderabad, IN;

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01);
Abstract

An enterprise level Application Programming Interface (API) driven service to integrate and automate data quality processes within organizations is provided. The service has capabilities to ingest data from heterogenous data sources and provide data quality metrics irrespective of data domain type. A subscribing application can write Data Quality (DQ) checks as code using templates of a customized rule engine and generate metrics based on pre-defined schedules. Analytics and visualization and reporting capabilities of the service empower stakeholders such as data managers, application developers, and risk assessors to obtain actionable insights into data quality. Stakeholders can use service-generated DQ measures, such as accuracy, completeness, and timeliness, to identify data quality concerns and proactively implement remediation actions to reduce data use risk. Artificial Intelligence (AI)/Machine Learning (ML) modeling techniques are used to analyze data quality, identify data anomalies, measure data quality metrics, and generate an overall data quality score.


Find Patent Forward Citations

Nirantar, Prashant. (2024). Method and system for providing data quality as a service (U.S. Patent No. 12050569). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12050569

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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