The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Jul. 08, 2020
Applicant:

Beijing Tusen Weilai Technology Co., Ltd., Beijing, CN;

Inventors:

Ming Wang, Beijing, CN;

Xiaodi Hou, San Diego, CA (US);

Jianan Hao, Beijing, CN;

Jie Sun, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/486 (2020.01); G01S 7/4865 (2020.01); G01S 17/894 (2020.01); H04N 5/33 (2023.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/4865 (2013.01); G01S 7/4868 (2013.01); H04N 5/33 (2013.01);
Abstract

The present disclosure provides an image capturing control method and apparatus, an image capturing system and a Time-of-Flight (TOF) camera, capable of solving the problem in the related art that a clear image of an object at a specific distance cannot be captured in harsh weather. The method includes: determining infrared light emission time, exposure start time and exposure end time for a TOF camera based on a predetermined target distance range; transmitting, to the TOF camera, parameter control information containing the infrared light emission time, exposure start time and exposure end time; and receiving an image containing an object located within the target distance range that is captured by the TOF camera in accordance with the parameter control information.


Find Patent Forward Citations

Loading…