The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Dec. 04, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Hiroshi Imai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); G06T 7/20 (2017.01); G06V 10/24 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G01N 21/89 (2013.01); G01N 21/8851 (2013.01); G06T 7/0002 (2013.01); G06T 7/20 (2013.01); G06V 10/24 (2022.01); G06V 10/761 (2022.01);
Abstract

The coordinate system fixing unit uses the displacement of an object under measurement between photographed images in chronological order to generate fixed-coordinate chronological images. The displacement calculation unit uses the fixed-coordinate chronological images to calculate a two-dimensional spatial distribution of the displacement of the surface of the object under measurement. The displacement difference calculation unit calculates a two-dimensional displacement difference distribution by removing an error component from the two-dimensional spatial distribution. The depth movement amount calculation unit calculates a depth movement amount from the two-dimensional displacement difference distribution. The displacement separation unit calculates in-plane displacement from the two-dimensional displacement difference distribution. The determination unit uses the in-plane displacement and/or the depth movement amount to determine whether there is an abnormality in the object under measurement.


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