The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Jul. 19, 2019
Applicant:
Omya International Ag, Oftringen, CH;
Inventors:
Roger Bollström, Zofingen, CH;
Kai Max Hettmann, Grenzach-Wyhlen, DE;
Assignee:
OMYA INTERNATIONAL AG, Oftringen, CH;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); B41M 3/14 (2006.01); B42D 25/382 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); B41M 3/14 (2013.01); B42D 25/382 (2014.10); G01N 2201/0633 (2013.01);
Abstract
The present invention refers to method for detecting phosphate and/or sulphate salts on the surface of a substrate or within a substrate, use of a LWIR detecting device for detecting the intensity of electromagnetic radiation scattered and/or emitted reflection by phosphate and/or sulphate salts being present on and/or in a substrate, use of a substrate comprising phosphate and/or sulphate salts for providing information via electromagnetic radiation scattering and/or emission as well as a LWIR imaging system for detecting phosphate and/or sulphate salts on and/or within a substrate.