The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Mar. 20, 2020
Applicant:

Precision Planting Llc, Tremont, IL (US);

Inventors:

Chad E. Plattner, Tremont, IL (US);

Philip Steiner, Tremont, IL (US);

Assignee:

Precision Planting LLC, Tremont, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); A01C 7/10 (2006.01); G01N 15/00 (2024.01); G01N 15/10 (2024.01); G01N 15/1434 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1459 (2013.01); A01C 7/105 (2013.01); G01N 15/1434 (2013.01); G01N 2015/0046 (2013.01); G01N 2015/1027 (2024.01); G01N 2015/1486 (2013.01); G01N 2015/1493 (2013.01);
Abstract

In one embodiment a first light plane is generated across the passageway by a first LED emitter array. A corresponding photodiode receiver array detects particles passing through a first number of light channels comprising the first light plane. In a second embodiment a second light plane is generated across the passageway at 90 degrees from the first light plane and longitudinally offset from the first light plane by a second LED emitter array. A corresponding photodiode receiver array detects particles passing through a second number of light channels comprising the second light plane. The second light plane is capable of identifying particles in a third dimension that may go undetected when passing through the first light plane. The raw output signals generated by respective photodiodes is normalized, analyzed and characterized to differentiate between particles passing through light planes as individual particles or groups of overlapping particles to be separately counted.


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