The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Oct. 20, 2020
Yokogawa Electric Corporation, Tokyo, JP;
Kodai Murayama, Musashino, JP;
Toshiyuki Saruya, Musashino, JP;
Fumie Watanabe, Musashino, JP;
Risa Hara, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A spectroscopic analysis device () according to the present disclosure includes a controller () that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L) irradiated by an irradiator () with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.