The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Jul. 10, 2018
Applicant:

Aetc Sapphire, Saint Petersburg, RU;

Inventors:

Jean-Jacques Bry, Champigneulles, FR;

Loic Vincent, Belfort, FR;

Lionel Julliand, Belfort, FR;

Pierre Humbert, Champigneulles, FR;

Jan Hemmelmann, Garching Bei Munchen, DE;

Assignee:

AETC SAPPHIRE, Saint Petersburg, RU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B63B 79/10 (2020.01); B63H 5/125 (2006.01); G01B 11/16 (2006.01); G01B 17/04 (2006.01); G01L 5/12 (2006.01);
U.S. Cl.
CPC ...
B63B 79/10 (2020.01); B63H 5/125 (2013.01); G01B 11/16 (2013.01); G01B 17/04 (2013.01); B63H 5/1252 (2013.01); B63H 2005/1258 (2013.01); G01L 5/12 (2013.01);
Abstract

The invention relates to a method for determining the direction and the amplitude of a force applied to a system (IO) comprising a stationary portion () and a mobile portion () which can deform when exposed to said force. Mechanical deformations applied to the mobile portion when exposed to said force are measured by measuring a distance between the stationary portion and the mobile portion in the direction of application of the force, and the distance measurements are processed in order to determine the amplitude and the direction of the force.


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