The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Mar. 11, 2020
Renishaw Plc, Wotton-under-Edge, GB;
Graham Richard Ferguson, Rodborough, GB;
Stephen Lindsey Tocknell, Chalford, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
An optical tool measurement device for a machine tool is described. The device includes a light source for directing light towards a tool-sensing region and a sensor for detecting light from the tool-sensing region. A shutter assembly for selectively protecting the sensor from contamination is also provided. The shutter assembly is to provide a closed configuration in which the sensor is covered by the shutter assembly thereby preventing contamination of the sensor and an open configuration in which light can pass to the sensor through a first aperture of the shutter assembly. Furthermore, the shutter assembly is configured to additionally provide a constricted configuration in which light can pass to the sensor through a second aperture of the shutter assembly, the second aperture being smaller than the first aperture. In this manner, the device has enhanced resistance to contaminants, such as swarf and coolant, present in the machine tool environment.