The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Oct. 26, 2022
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Dattesh Dayanand Shanbhag, Bangalore, IN;

Chitresh Bhushan, Glenville, NY (US);

Deepa Anand, Bangalore, IN;

Kavitha Manickam, Pewaukee, WI (US);

Dawei Gui, Sussex, WI (US);

Radhika Madhavan, Latham, NY (US);

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/20 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); G01R 33/20 (2013.01); G01R 33/5608 (2013.01);
Abstract

A method for generating an image of a subject with a magnetic resonance imaging (MRI) system is presented. The method includes first performing a localizer scan of the subject to acquire localizer scan data. A machine learning (ML) module is then used to detect the presence of metal regions in the localizer scan data based on magnitude and phase information of the localizer scan data. Based on the detected metal regions in the localizer scan data, the MRI workflow is adjusted for diagnostic scan of the subject. The image of the subject is then generated using the adjusted workflow.


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