The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Mar. 19, 2021
Applicant:

Optos Plc, Dunfermline, GB;

Inventors:

Praveen Cheriyan Ashok, Dunfermline, GB;

Michael Verhoek, Dunfermline, GB;

Sriram Vikraman Sithalakshmi Amma, Dunfermline, GB;

Assignee:

OPTOS PLC, Dunfermline, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/1005 (2013.01); A61B 3/102 (2013.01); G16H 30/40 (2018.01);
Abstract

A technique for generating a mapping relating values of a scan parameter of an ocular imaging apparatus that are indicative of scan locations in an eye at which the apparatus acquires digital images of imaged regions of the eye, to respective values of a conversion factor for calculating a distance between designated ocular features in the imaged regions, by: simulating light ray propagation to relate each value of the scan parameter in a sequence of scan parameter values to a corresponding location in a model eye; calculating, for each scan parameter value, a distance between the corresponding location in the model eye and a location in the model eye corresponding to an adjacent value in the sequence; and using the calculated distances to generate a respective value of the conversion factor for each scan parameter value.


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