The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Apr. 11, 2023
Applicant:

Covidien Lp, Mansfield, MA (US);

Inventor:

Haley E. Strassner, Hamden, CT (US);

Assignee:

Covidien LP, Mansfield, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 17/115 (2006.01); A61B 90/00 (2016.01); A61B 17/00 (2006.01); A61B 17/11 (2006.01);
U.S. Cl.
CPC ...
A61B 17/1155 (2013.01); A61B 90/06 (2016.02); A61B 2017/00119 (2013.01); A61B 2017/1142 (2013.01); A61B 2090/064 (2016.02); A61B 2562/0261 (2013.01);
Abstract

A computer-implemented method for controlling a surgical stapling instrument for stapling tissue includes advancing an anvil assembly in relation to a staple cartridge to a first position defining a tissue gap between the staple cartridge and the anvil assembly and clamping tissue, the clamped tissue including a suture, measuring a first force of tissue compression of the tissue clamped within the tissue gap with the anvil assembly at a first time point, determining whether the measured first force is greater than a threshold, measuring a second force of tissue compression of the tissue clamped within the tissue gap at a second time point in response to the determination that the first force is greater than the threshold, determining whether the suture failed based on the measured second force being an amount less than the measured first force, and stopping the advancing of the anvil assembly based on the determined suture failure.


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