The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Dec. 04, 2019
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Shiori Sasada, Kanagawa, JP;

Kento Takenaka, Tokyo, JP;

Kazuo Ohtsuka, Tokyo, JP;

Mamoru Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); A61B 1/00 (2006.01); G06T 3/40 (2006.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01); H04N 7/18 (2006.01); H04N 23/50 (2023.01);
U.S. Cl.
CPC ...
A61B 1/000094 (2022.02); A61B 1/000096 (2022.02); A61B 1/0005 (2013.01); G06T 3/40 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 11/00 (2013.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01); H04N 7/183 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30004 (2013.01); H04N 23/555 (2023.01);
Abstract

There is provided a medical support system including: a derivation device that derives an assessment value for an affected site based on an affected site image obtained by imaging the affected site; and a display device that presents the assessment value to a user, in which the derivation device includes: a cut-out unit that cuts out the affected site image as a plurality of tile images having tile shapes; and an assessment derivation unit that derives a tile assessment value representing an assessment of the affected site in the plurality of the tile images by using a determiner obtained by machine learning.


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