The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Jul. 31, 2020
Sharp Kabushiki Kaisha, Osaka, JP;
Huifa Lin, Sakai, JP;
Shoichi Suzuki, Sakai, JP;
Daiichiro Nakashima, Sakai, JP;
Toshizo Nogami, Sakai, JP;
Wataru Ouchi, Sakai, JP;
Tomoki Yoshimura, Sakai, JP;
Taewoo Lee, Sakai, JP;
SHARP KABUSHIKI KAISHA, Sakai, JP;
Abstract
A terminal apparatus receives a DCI format used for scheduling of a PDSCH, and transmits HARQ-ACK information in a slot n. In a case that a higher layer parameter is given, for a PDSCH group g, a monitoring occasion for PDCCH corresponding to a DCI format satisfying a condition is included in a set of monitoring occasions for PDCCH for the slot n. Based at least on the set of monitoring occasions for PDCCH for the slot n, the HARQ-ACK information is generated. The condition includes the following: condition 1 is that the HARQ-ACK information corresponding to the PDSCH scheduled by the DCI format is triggered to be transmitted in the lot n, and condition 2 is that the PDSCH group g is indicated by a PGI field included in the DCI format.