The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Mar. 07, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Fangzhou Zhu, Shenzhen, CN;

Mingxuan Yuan, Hong Kong, CN;

Jia Zeng, Hong Kong, CN;

Weixiong Rao, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); G06N 20/00 (2019.01); H04W 24/10 (2009.01); H04W 72/0446 (2023.01); H04W 76/11 (2018.01);
U.S. Cl.
CPC ...
H04W 64/003 (2013.01); G06N 20/00 (2019.01); H04W 24/10 (2013.01); H04W 72/0446 (2013.01); H04W 76/11 (2018.02);
Abstract

A method for obtaining an emission probability includes obtaining a plurality of measurement reports (MRs) of a terminal in a target region and an engineering parameter of at least one base station in the target region, obtaining, based on parameter information in each of the plurality of MRs and the engineering parameter of the at least one base station, a feature vector corresponding to each of the plurality of MRs, processing, using a regression model, location information in each of the plurality of MRs and the feature vector corresponding to each of the plurality of MRs, to obtain a single-point positioning model, calculating, based on the single-point positioning model, the location information in each of the plurality of MRs, and the feature vector corresponding to each of the plurality of MRs, an emission probability of the feature vector corresponding to each of the plurality of MRs.


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