The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

May. 25, 2022
Applicant:

GE Video Compression, Llc, Albany, NY (US);

Inventors:

Gerhard Tech, Berlin, DE;

Karsten Mueller, Berlin, DE;

Thomas Wiegand, Berlin, DE;

Assignee:

GE Video Compression, LLC, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/161 (2018.01); G06T 15/20 (2011.01); H04N 13/111 (2018.01); H04N 13/122 (2018.01); H04N 13/128 (2018.01);
U.S. Cl.
CPC ...
H04N 13/161 (2018.05); G06T 15/205 (2013.01); H04N 13/111 (2018.05); H04N 13/122 (2018.05); H04N 13/128 (2018.05);
Abstract

An apparatus for determining a measure for a distortion change of a first view synthesized from a second view, caused by a modification of a depth map of the second view from a first state to a second state, is configured—starting from a current synthesis state of the first view corresponding to a synthesis from the second view having the depth map modified to the second state in an already processed portion of the depth map and having the depth map unmodified at the first state in a yet to be processed portion of the depth map—to compute a possible successor synthesis state corresponding to a synthesis of the first view from the second view having the depth map modified to the second state in an already processed portion plus a currently processed portion and having the depth map unmodified at the first state in the yet to be processed portion without the currently processed portion; and to determine a distortion change of a distortion of the current synthesis state of the first view relative to an undistorted version of the first view to a distortion of the possible successor synthesis state of the first view relative to the undistorted version of the first view.


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