The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Mar. 14, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Ryo Mikami, Tokyo, JP;

Kenichirou Haruta, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00819 (2013.01); H04N 1/00087 (2013.01); H04N 1/00092 (2013.01);
Abstract

An image-forming unit forms a referential image on a first sheet. A reading unit reads the referential image on the first sheet to generate referential read image data. A calibration unit calibrates input image data using calibration parameters derived based on the referential read image data. The image-forming unit forms a target image on a second sheet based on the calibrated data. The reading unit reads the target image on the second sheet to generate read image data for inspection. An inspection unit inspects quality of the target image based on comparison between the input image data and the read image data for inspection. The calibration parameters are derived based on the referential read image data to which flare correction has been applied. The inspection unit compares the input image data with the corrected read image data.


Find Patent Forward Citations

Loading…