The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

May. 12, 2020
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Ramon Gutierrez Castrejon, Montreal, CA;

Saber Md Ghulam, Ottawa, CA;

David V. Plant, Montreal, CA;

Robert Brunner, Montreal, CA;

Luca Giorgi, Ponsacco, IT;

Tommaso Catuogno, Pisa, IT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/49 (2006.01); H04B 10/54 (2013.01); H04B 10/2513 (2013.01);
U.S. Cl.
CPC ...
H04L 25/4917 (2013.01); H04B 10/541 (2013.01); H04B 10/2513 (2013.01);
Abstract

Methods in an optical receiver, for decoding a received M-level pulse-amplitude-modulated, PAM-M, optical signal. An example method comprises, for a first interval, decoding () the received PAM-M optical signal using a standard PAM-M decoder with M-1 thresholds, using first sampling times, to obtain a first set of decoded bits, and decoding () the received PAM-M optical signal using a duobinary decoder with 2M-2 thresholds, at second sampling times offset from the first sampling times, to obtain second set of decoded bits. The method further comprises calculating () first and second error metrics corresponding to the first and second sets of decoded bits, respectively, and selecting () the standard PAM-M decoder or the duobinary decoder for subsequent decoding of the received PAM-M optical signal, based on the first and second error metrics.


Find Patent Forward Citations

Loading…