The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
May. 30, 2018
Shimadzu Corporation, Kyoto, JP;
Tomonori Oshikawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
After collecting mass spectrometry data for each of a large number of measurement points in the two-dimensional region on the sample with the imaging mass spectrometry unit, the user inputs the target compound whose two-dimensional distribution is desired to be observed from the input unit. The image display instruction reception unit obtains the m/z range for data integration from the precise m/z value and the allowable width of m/z for each target compound. The mass-to-charge ratio range overlap determination unit determines the presence or absence of overlap between the m/z ranges of a plurality of compounds, and if there is an overlap, the overlap determination result processing unit creates and displays on the screen of the display unit a list of compounds whose m/z ranges overlap, for example. This urges the user to review the compounds and allowable values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile