The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Feb. 16, 2021
Applicant:
Vec Imaging Gmbh & Co. KG, Erlangen, DE;
Inventors:
Houman Jafari, Erlangen, DE;
Bo Gao, Morrisville, NC (US);
Vance Scott Robinson, South Jordan, UT (US);
Assignees:
VEC Imaging GmbH & Co. KG, Erlangen, DE;
Varex Imaging Corporation, Salt Lake City, UT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/14 (2006.01); H01J 35/06 (2006.01); H01J 35/08 (2006.01); H01J 35/12 (2006.01); H05G 1/02 (2006.01);
U.S. Cl.
CPC ...
H01J 35/153 (2019.05); H01J 35/112 (2019.05); H01J 35/12 (2013.01); H01J 35/064 (2019.05); H01J 2235/068 (2013.01); H01J 2235/086 (2013.01); H05G 1/02 (2013.01);
Abstract
Some embodiments include a system, comprising: a plurality of x-ray sources, each x-ray source including: an electron source configured to generate an electron beam; and a target configured to receive the electron beam and convert the electron beam into an x-ray beam; wherein: at first x-ray source of the x-ray sources is different from a second x-ray source of the x-ray sources; and the targets of the x-ray sources are part of a linear target.