The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Jul. 16, 2019
Samsung Display Co., Ltd., Yongin-Si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Hoon Sohn, Daejeon, KR;
Sangwoo Choi, Cheonan-si, KR;
Minsang Koo, Seongnam-si, KR;
Sanghyuk Kwon, Seoul, KR;
Eunchul Shin, Cheonan-si, KR;
Woojin Jung, Hwaseong-si, KR;
Jiho Park, Daejeon, KR;
Soonkyu Hwang, Daejeon, KR;
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Abstract
An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.