The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Jun. 21, 2019
Servicenow Canada Inc., Montreal, CA;
Elena Busila, Montreal, CA;
Jerome Pasquero, Montreal, CA;
Tim Beiko, Montreal, CA;
Evelin Fonseca Cruz, Montreal, CA;
Minh-Kim Dao, Montreal, CA;
Majid Laali, Montreal, CA;
Patrick Lazarus, Montreal, CA;
ServiceNow Canada Inc., Montreal, CA;
Abstract
Systems and methods for document analysis. An image containing at least one document is received at a pre-processing stage and the image is analyzed for image quality. If the image quality is insufficient for further processing, this is adjusted until the image is suitable for further processing. After the image quality adjustment, the image is then passed to an initial processing stage. At the initial processing stage, the boundaries of one or more documents within the image are determined. In addition, the orientation of the image may be adjusted and the type of document(s) within the image is determined. From the initial processing stage, the adjusted image is then passed to a data extraction stage. At this stage, clusters of data within the document are determined and bounding boxes are placed around the clusters. Data regarding each of the clusters of data is then gathered.