The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Jun. 25, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takuya Ogawa, Tokyo, JP;

Takashi Shibata, Tokyo, JP;

Tetsuaki Suzuki, Tokyo, JP;

Hiroyoshi Miyano, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/25 (2022.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/25 (2022.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01); G06T 2207/20081 (2013.01);
Abstract

A learning device makes an object detection device learn how to detect an object from an input image. A feature extraction unit performs feature extraction from input images including real images and pseudo images to generate feature maps, and the object detection unit detects objects included in the input images based on the feature maps. The domain identification unit identifies the domains forming the input images and generates domain identifiability information. Then, the feature extraction unit and the object detection unit learn common features that do not depend on the difference in domains, based on the domain identifiability information.


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