The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Nov. 05, 2021
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Yi-Hsuan Tsai, Santa Clara, CA (US);
Masoud Faraki, San Jose, CA (US);
Yumin Suh, Santa Clara, CA (US);
Sparsh Garg, San Jose, CA (US);
Manmohan Chandraker, Santa Clara, CA (US);
Dongwan Kim, Seoul, KR;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06F 18/214 (2023.01); G06F 18/2415 (2023.01); G06F 18/2431 (2023.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06F 18/2148 (2023.01); G06F 18/2415 (2023.01); G06F 18/2431 (2023.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
Methods and systems for training a model include combining data from multiple datasets, the datasets having different respective label spaces. Relationships between labels in the different label spaces are identified. A unified neural network model is trained, using the combined data and the identified relationships to generate a unified model, with a class relational binary cross-entropy loss.