The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Dec. 24, 2021
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
Wei-Chun Wang, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for detecting defects in product applied in a computer device inputs an image of a product under test to an automatic encoder to obtain a reconstructed image, and the image is segmented into N image blocks and the reconstructed image is segmented into N image blocks. The computer device associates each of the N testing blocks with one reconstructed blocks according to positions of the N testing blocks in the image and positions of the N reconstructed blocks in the reconstructed image. The computer device further calculates mean square errors between each of the N testing blocks and each of the N reconstructed blocks, and associates each mean square error with each of the N testing blocks, whether the product has defects being determined based on the mean square errors corresponding to each of the N testing blocks.