The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Mar. 15, 2022
Ajou University Industry-academic Cooperation Foundation, Suwon-si, KR;
Myung Hoon Sunwoo, Seoul, KR;
Min Cheol Kim, Suwon-si, KR;
AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION, Suwon-si, KR;
Abstract
There are disclosed an apparatus and method for processing images. The apparatus for processing images according to an embodiment includes an image input unit configured to receive a first image of a Bayer pattern including noise and an image output unit configured to output a noise-removed image by removing noise from the first image using a noise removal model, and the noise removal model includes a color correlation block configured to generate a second image of the Bayer pattern including RGB correlation information about the first image from the first image by performing rearrange and convolution operations on the first image, a discrete cosine transform (DCT) block configured to generate a third image in which a high-frequency component of the first image is highlighted by applying a DCT to the first image, and one or more discrete wavelet transform (DWT) blocks configured to generate a low-frequency feature map and one or more high-frequency feature maps by applying a DWT to a first feature map generated based on the first image, the second image, and the third image, and generate a final feature map in which a high-frequency component and a low-frequency component of the first feature map are highlighted based on the low-frequency feature map and the one or more high-frequency feature maps.