The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Mar. 24, 2021
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Peder A. Olsen, Redmond, WA (US);

Ranveer Chandra, Kirkland, WA (US);

Olaoluwa Adigun, Los Angeles, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06T 3/4053 (2024.01); G06T 3/4076 (2024.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G06T 3/4053 (2013.01); G06T 3/4076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Systems and methods for generating predicted high-resolution images from low-resolution images. To generate the predicted high-resolution images, the present technology may utilize machine learning models and super resolution models in a series of processes. For instance, the low-resolution images may undergo a sensor transformation based on processing by a machine learning model. The low-resolution images may also be combined with land structure features and/or prior high-resolution images to form an augmented input that is processed by a super resolution model to generate an initial predicted high-resolution image. The predicted initial high-resolution image may be combined or stacked with other predicted high-resolution images to form a stacked image. That stacked image may then be processed by another super resolution model to generate a final predicted high-resolution image.


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