The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Sep. 08, 2021
Peng Cheng Laboratory, Shenzhen, CN;
Tao Wei, Shenzhen, CN;
Yonghong Tian, Shenzhen, CN;
Yaowei Wang, Shenzhen, CN;
Yun Liang, Shenzhen, CN;
Chang Wen Chen, Shenzhen, CN;
Wen Gao, Shenzhen, CN;
Peng Cheng Laboratory, Shenzhen, CN;
Abstract
Disclosed is a method and system for achieving optimal separable convolutions, the method is applied to image analyzing and processing and comprises steps of: inputting an image to be analyzed and processed; calculating three sets of parameters of a separable convolution: an internal number of groups, a channel size and a kernel size of each separated convolution, and achieving optimal separable convolution process; and performing deep neural network image process. The method and system in the present disclosure adopts implementation of separable convolution which efficiently reduces a computational complexity of deep neural network process. Comparing to the FFT and low rank approximation approaches, the method and system disclosed in the present disclosure is efficient for both small and large kernel sizes and shall not require a pre-trained model to operate on and can be deployed to applications where resources are highly constrained.