The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Nov. 22, 2019
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Florian Fahrbach, Mannheim, DE;

Werner Knebel, Kronau, DE;

Ulf Schwarz, Mannheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G02B 21/0032 (2013.01); G01N 21/6458 (2013.01);
Abstract

A method for high-resolution imaging includes illuminating a target region of a specimen by first and second illumination light beams during respective holding durations to transfer respective subsets of fluorophores from a first into a second state. The fluorophores emit fluorescence photons upon transition from the second back into the first state, which are used to produce respective raw images. The illumination light beams have different power and/or beam profiles. A high-resolution image is produced from the raw images. The respective holding durations are shorter than a lifetime of a third state of the fluorophores, into which a third subset of the fluorophores is transferred by the illumination of the target region by the first and/or second illumination light beam, and the lifetime of the third state is longer by a factor of at least 2 than a lifetime of the second state.


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